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CHICAGO--Lots of test gear can measure jitter, but Anritsu Co. introduced the first single-instrument solution for differential electrical jitter testing of 10 GB XFP modules. It also tests the electrical interfaces connecting host cards to the modules.

The MP1590B network performance tester has a 10 GB differential input/output (I/O) feature that can be used by design engineers responsible for the verification of XFP modules, as well as carriers for performance monitoring.

“It seems like such a subtle thing, but XFP modules are so important,” said Jack Landau, marketing communications manager for Anritsu.

The MP1590B provides more accurate results than existing solutions that perform single-ended electrical analysis or that verify optical performance. Existing solutions test jitter, but not differentiated jitter. The test gear provides accurate electrical measurement of all jitter-causing conditions, including polarity and amplitude conditions. It can measure the accuracy of the XFP modules at a rate of +/-20 mUI (milli unit intervals).

“Most people can’t say what their accuracy is, but if you can’t say, you might as well use a non-differential [methods] because the whole measurement is meaningless,” Landau said.

The MP1590B’s low intrinsic jitter generation and high receiver accuracy are critical for accurate measurement results on XFP modules, which are used in switch and router and other networking components. It supports various interfaces, including Sonet/OTN up to 10.7G, Ethernet up to 10 GB, Ethernet over Sonet, PPP and Cisco HDLC. Additionally, it supports both high order and low order virtual concatenation.